|
Overview
|
Previous Top Next |
| InP carrier concentration
|
| SCOUT analyzes an infrared reflectance spectrum and adjusts the two parameters of a Drude model. From the obtained values the carrier concentration is computed and displayed.
|
| Si epilayer thickness
|
| SCOUT analyzes an infrared reflectance spectrum to determine the thickness of an undoped silicon layer on a doped silicon substrate. This classical example of IR semiconductor analysis is used to demonstrate how SCOUT can be configured for operation by unexperienced users.
|
|
|
| AlGaAs: Optical constants and superlattice reflectivity
|
| Using flexible interband transition models the optical constants of AlGaAs are computed for arbitrary aluminum content. The reflectivity of a double layer (which differ in their Al content from each other) which is repeated many times (on a GaAs substrate) is calculated.
|
|
|
| SiOx layer on glass
|
| Oxygen content and thickness of a SiOx layer on glass is obtained from transmittance and reflectance spectra. This example demonstrates the combination of the 'fit on a grid' and 'downhill simplex' fitting techniques.
|
| Bragg filter: Optical design
|
| This example shows how you can use CODE to investigate spectra and colors of optical filters.
|
|
|
| Low-e-coating: Color variation with angle of incidence
|
| CODE is used to investigate the dependence of the color of an optical coating on the angle of incidence.
|