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After having defined the materials of your project and the structure of the layer stacks you have to specify which spectra are to be computed. This is done in the spectra list which collects all spectra that you want to calculate. Each spectrum is defined in its own window where you can also import an experimental spectrum for visual comparison and automatic fitting of the model. The goal of the automatic fitting is to minimize the deviation (mean squared difference) between simulated and measured data.

If you fit several spectra (Reflectance and transmittance, transmittance and ellipsometry, reflectance spectra at various angles of incidence or polarization) the total deviation is computed as the sum of the deviations of the individual spectra. The latter are multiplied with a weight factor that you can set for each spectrum in the list of spectra.

 

At present the following types of spectra can be simulated with SCOUT:

 

Reflectance
Transmittance
Absorbance
ATR
Layer Mix (computes the average spectrum of a patterned sample)
Ellipsometry
Ellipsometry stack average
PL spectrum
EL spectrum
Layer absorption (computes the absorbed fraction of incident light intensity in a certain layer in a stack)
Charge carrier generation (computes the number of photon-generated charge carriers in a layer)